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"Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier ..."

Michiel Vandemaele et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118211

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/irps/VandemaeleKBFCMMHG23
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  - https://dblp.org/rec/conf/irps/VandemaeleKBFCMMHG23
Michiel Vandemaele, Ben Kaczer, Erik Bury, Jacopo Franco, Adrian Chasin, Alexander Makarov, Hans Mertens, Geert Hellings, Guido Groeseneken:
Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper. IRPS 2023: 1-10

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