Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Improvement of oxide reliability in NAND flash memories using tight ..."

Riichiro Shirota et al. (2015)

> Home

Details and statistics

DOI: 10.1109/IRPS.2015.7112814

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/ShirotaYCWWCYAT15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/ShirotaYCWWCYAT15
Riichiro Shirota, Bo-Jun Yang, Yung-Yueh Chiu, Yu-Ting Wu, Pin-Yao Wang, Jung-Ho Chang, Masaru Yano, Minoru Aoki, Toshiaki Takeshita, C.-Y. Wang, Ikuo Kurachi:
Improvement of oxide reliability in NAND flash memories using tight endurance cycling with shorter idling period. IRPS 2015: 12

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.