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"Gate Stability and Robustness of In-Situ Oxide GaN Interlayer Based ..."
Maria Ruzzarin et al. (2019)
- Maria Ruzzarin
, Matteo Borga
, Enrico Zanoni
, Matteo Meneghini, Gaudenzio Meneghesso, Dong Ji, Wenwen Li, Silvia H. Chan, Anchal Agarwal, Chirag Gupta, Stacia Keller, Umesh K. Mishra, Srabanti Chowdhury
:
Gate Stability and Robustness of In-Situ Oxide GaN Interlayer Based Vertical Trench MOSFETs (OG-FETs). IRPS 2019: 1-5
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