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"A moisture-related breakdown mechanism in low-k dielectrics using a ..."
Sean P. Ogden et al. (2015)
- Sean P. Ogden, Juan Borja, Huawei Zhou, Joel L. Plawsky, Toh-Ming Lu, William N. Gill:
A moisture-related breakdown mechanism in low-k dielectrics using a multiple I-V ramp test. IRPS 2015: 4
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