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"Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm ..."

Wang Liao et al. (2019)

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DOI: 10.1109/IRPS.2019.8720568

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
  - conf/irps/LiaoHMWANTTTM19
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  - https://dblp.org/rec/conf/irps/LiaoHMWANTTTM19
Wang Liao, Masanori Hashimoto, Seiya Manabe, Yukinobu Watanabe, Shin-ichiro Abe, Keita Nakano, Hayato Takeshita, Motonobu Tampo, Soshi Takeshita, Yasuhiro Miyake:
Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs. IRPS 2019: 1-5

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