"Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive ..."

Zhiqing Li et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128351

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Zhiqing Li, Baofu Zhu, Anindya Nath, Meng Miao, Alain Loiseau, You Li, Jeffrey B. Johnson, Souvick Mitra, Robert Gauthier:
Understanding ESD Induced Thermal Mechanism in FinFETs Through Predictive TCAD Simulation. IRPS 2020: 1-4

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