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"Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled ..."

Nam-Hyun Lee et al. (2019)

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DOI: 10.1109/IRPS.2019.8720444

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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  dblp key:
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Nam-Hyun Lee, Jongkyun Kim, Donghee Son, Kangjun Kim, Jung Eun Seok:
Comprehensive Study for OFF-State Hot Carrier Degrdation of Scaled nMOSFETs in DRAM. IRPS 2019: 1-4

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