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"Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs."

Ethan S. Lee et al. (2019)

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DOI: 10.1109/IRPS.2019.8720550

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-02

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  dblp key:
  - conf/irps/LeeHJKPA19
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  - https://dblp.org/rec/conf/irps/LeeHJKPA19
Ethan S. Lee, Luis Hurtado, Jungwoo Joh, Srikanth Krishnan, Sameer Pendharkar, Jesús A. del Alamo:
Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs. IRPS 2019: 1-5

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