"Effect of Frequency on Reliability Of High-K MIM Capacitors."

X. Federspiel et al. (2023)

> Home

Details and statistics

DOI: 10.1109/IRPS48203.2023.10117790

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/FederspielGBL23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/FederspielGBL23
X. Federspiel, A. Griffon, M. Barlas, P. Lamontagne:
Effect of Frequency on Reliability Of High-K MIM Capacitors. IRPS 2023: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.