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"Atomic force microscope tip localization and tracking through deep ..."

Shuai Liang et al. (2019)

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DOI: 10.1109/IROS40897.2019.8968567

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Shuai Liang, Mokrane Boudaoud, Catherine Achard, Weibin Rong, Stéphane Régnier:
Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope. IROS 2019: 2435-2440

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