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"A comprehensive variability study of doped HfO2 FeFET for memory applications."

Nicolo Ronchi et al. (2022)

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DOI: 10.1109/IMW52921.2022.9779294

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-13

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  dblp key:
  - conf/imw2/RonchiRCKKBMbH22
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  - https://dblp.org/rec/conf/imw2/RonchiRCKKBMbH22
Nicolo Ronchi, Lars-Åke Ragnarsson, Umberto Celano, Ben Kaczer, K. Kaczmarek, K. Banerjee, Sean R. C. McMitchell, G. Van den Bosch, Jan Van Houdt:
A comprehensive variability study of doped HfO2 FeFET for memory applications. IMW 2022: 1-4

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