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"Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash ..."

Viktor Markov et al. (2023)

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DOI: 10.1109/IMW56887.2023.10145950

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-16

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  dblp key:
  - conf/imw2/MarkovFSLJK23
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  - https://dblp.org/rec/conf/imw2/MarkovFSLJK23
Viktor Markov, Gilles Festes, Louisa Schneider, Steven Lemke, Serguei Jourba, Alexander Kotov:
Effect of High-Temperature Bake on RTN Statistics in Floating Gate Flash Memory Arrays. IMW 2023: 1-4

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