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"Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test ..."
Xiaoqing Wen et al. (2006)
- Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja:
Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. ICCD 2006: 251-258
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