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"Selecting A Well Distributed Hard Case Test Suite for IEEE Standard ..."

Lee D. McFearin, David W. Matula (2001)

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DOI: 10.1109/ICCD.2001.955008

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Lee D. McFearin, David W. Matula:
Selecting A Well Distributed Hard Case Test Suite for IEEE Standard Floating Point Division. ICCD 2001: 89-97

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