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"An Automatic Test Pattern Generation Framework for Combinational Threshold ..."

Pallav Gupta, Rui Zhang, Niraj K. Jha (2004)

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DOI: 10.1109/ICCD.2004.1347974

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/iccd/GuptaZJ04
Pallav Gupta, Rui Zhang, Niraj K. Jha:
An Automatic Test Pattern Generation Framework for Combinational Threshold Logic Networks. ICCD 2004: 540-543

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