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"Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide ..."
Chin-Long Wey et al. (2004)
- Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba:
Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. ACM Great Lakes Symposium on VLSI 2004: 322-327
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