default search action

combined dblp search
author search
venue search
publication search

ask others

Gregory Wierzba

> Home > Persons

Person information

affiliation: Michigan State University, East Lansing, MI, USA

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2000 – 2009

see FAQ

What is the meaning of the colors in the publication lists?

2004
[c1]
- view
  authority control:
- export record
  dblp key:
  - conf/glvlsi/WeyKLW04
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/WeyKLW04
Chin-Long Wey, Mohammad Athar Khalil, Jim Liu, Gregory Wierzba:
Hierarchical extreme-voltage stress test of analog CMOS ICs for gate-oxide reliability enhancement. ACM Great Lakes Symposium on VLSI 2004: 322-327

Coauthor Index

see FAQ

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.