"Compaction of Compressed Bounded Transparent-Scan Test Sets."

Irith Pomeranz (2022)

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DOI: 10.1145/3526241.3530358

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-03

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Irith Pomeranz:
Compaction of Compressed Bounded Transparent-Scan Test Sets. ACM Great Lakes Symposium on VLSI 2022: 339-343

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