"Algorithms for the Selection of Applied Tests when a Stored Test Produces ..."

Hari Addepalli, Irith Pomeranz (2022)

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DOI: 10.1145/3526241.3530359

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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Hari Addepalli, Irith Pomeranz:
Algorithms for the Selection of Applied Tests when a Stored Test Produces Many Applied Tests. ACM Great Lakes Symposium on VLSI 2022: 345-349

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