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"Scan cell reordering to minimize peak power during test cycle: A graph ..."

Jaynarayan T. Tudu et al. (2010)

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DOI: 10.1109/ETSYM.2010.5512732

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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  - conf/ets/TuduLSF10
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Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara:
Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach. ETS 2010: 259

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