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ORCID"A novel delay fault testing methodology using on-chip low-overhead delay ..."
Arijit Raychowdhury et al. (2005)
- Arijit Raychowdhury, Swaroop Ghosh, Swarup Bhunia
, Debjyoti Ghosh, Kaushik Roy:
A novel delay fault testing methodology using on-chip low-overhead delay measurement hardware at strategic probe points. ETS 2005: 108-113
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