"On estimation of NBTI-Induced delay degradation."

Mitsumasa Noda et al. (2010)

> Home

Details and statistics

DOI: 10.1109/ETSYM.2010.5512772

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ets/NodaKSMWM10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ets/NodaKSMWM10
Mitsumasa Noda, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen, Yukiya Miura:
On estimation of NBTI-Induced delay degradation. ETS 2010: 107-111

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.