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"On the selection of efficient arithmetic additive test pattern generators ..."

Salvador Manich et al. (2003)

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DOI: 10.1109/ETW.2003.1231662

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-04

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  - conf/ets/ManichGBLRRF03
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Salvador Manich, L. García, Luz Balado, Emili Lupon, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras:
On the selection of efficient arithmetic additive test pattern generators [logic test]. ETW 2003: 9-14

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