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"Test pattern selection to optimize delay test quality with a limited size ..."
Michiko Inoue et al. (2010)
- Michiko Inoue, Akira Taketani, Tomokazu Yoneda, Hiroshi Iwata, Hideo Fujiwara:
Test pattern selection to optimize delay test quality with a limited size of test set. ETS 2010: 260
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