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"A built-in self-test scheme for classifying refresh periods of DRAMs."

Chia-Ming Chang, Yong-Xiao Chen, Jin-Fu Li (2017)

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DOI: 10.1109/ETS.2017.7968245

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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Chia-Ming Chang, Yong-Xiao Chen, Jin-Fu Li:
A built-in self-test scheme for classifying refresh periods of DRAMs. ETS 2017: 1-2

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