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"Process-variability aware delay fault testing of ΔVT and ..."

Daniel Arumí-Delgado et al. (2003)

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DOI: 10.1109/ETW.2003.1231673

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-27

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  - conf/ets/Arumi-DelgadoRG03
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Daniel Arumí-Delgado, Rosa Rodríguez-Montañés, José Pineda de Gyvez, Guido Gronthoud:
Process-variability aware delay fault testing of ΔV_T and weak-open defects. ETW 2003: 85-90

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