"Derivation of the reliability metric for digital circuits."

Mohamed A. Abufalgha, Alex Bystrov (2017)

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DOI: 10.1109/ETS.2017.7968224

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Mohamed A. Abufalgha, Alex Bystrov:
Derivation of the reliability metric for digital circuits. ETS 2017: 1-2

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