"Impact of Bottom Electrode Roughness on the Analog Switching ..."

Wenbin Zhang et al. (2021)

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DOI: 10.1109/DRC52342.2021.9467220

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-06

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Wenbin Zhang, Jianshi Tang, Bin Gao, Wen Sun, Wei Liu, Kanwen Wang, Wei Wu, He Qian, Huaqiang Wu:
Impact of Bottom Electrode Roughness on the Analog Switching Characteristics in Nanoscale RRAM Array. DRC 2021: 1-2

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