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"Understanding of Multiple Resistance States by Current-sweep Measurement ..."

Xiaohan Wu et al. (2020)

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DOI: 10.1109/DRC50226.2020.9135187

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-27

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Xiaohan Wu, Ruijing Ge, Deji Akinwande, Jack C. Lee:
Understanding of Multiple Resistance States by Current-sweep Measurement and Compliance Current Modulation in 2D MoS2-based Non-volatile Resistance Switching Devices. DRC 2020: 1-2

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