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Jack C. Lee
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2020 – today
- 2021
- [c4]Yao-Feng Chang, Ilya Karpov, Reed Hopkins, David Janosky, Jacob Medeiros, Benjamin Sherrill, Jiahan Zhang, Yifu Huang
, Tanmoy Pramanik, Albert B. Chen, Tony Acosta, Abdullah Guler, James A. O'Donnell, Pedro A. Quintero, Nathan Strutt, Oleg Golonzka, Chris Connor, Jack C. Lee, Jeffrey Hicks:
Embedded emerging memory technologies for neuromorphic computing: temperature instability and reliability. IRPS 2021: 1-5 - 2020
- [j10]Mostafa Rahimi Azghadi
, Ying-Chen Chen, Jason Kamran Eshraghian, Jia Chen, Chih-Yang Lin, Amirali Amirsoleimani, Adnan Mehonic, Anthony J. Kenyon
, Burt Fowler, Jack C. Lee, Yao-Feng Chang:
Complementary Metal-Oxide Semiconductor and Memristive Hardware for Neuromorphic Computing. Adv. Intell. Syst. 2(5): 1900189 (2020) - [j9]Mostafa Rahimi Azghadi
, Ying-Chen Chen, Jason Kamran Eshraghian, Jia Chen, Chih-Yang Lin, Amirali Amirsoleimani, Adnan Mehonic, Anthony J. Kenyon, Burt Fowler, Jack C. Lee, Yao-Feng Chang:
Complementary Metal-Oxide Semiconductor and Memristive Hardware for Neuromorphic Computing. Adv. Intell. Syst. 2(5): 2070050 (2020) - [c3]Xiaohan Wu, Ruijing Ge, Deji Akinwande, Jack C. Lee:
Understanding of Multiple Resistance States by Current-sweep Measurement and Compliance Current Modulation in 2D MoS2-based Non-volatile Resistance Switching Devices. DRC 2020: 1-2
2010 – 2019
- 2019
- [c2]Ying-Chen Chen, Szu-Tung Hu, Chao-Cheng Lin, Jack C. Lee:
Resistive Switching Early Failure and Gap Identification in Bilayer Selectorless RRAM Applications. DRC 2019: 89-90 - 2018
- [c1]Ying-Chen Chen, Xiaohan Wu, Yao-Feng Chang, Jack C. Lee:
Nonlinearity Enhancement by Positive Pulse Stress in Multilevel Cell Selectorless RRAM Applications. DRC 2018: 1-2
2000 – 2009
- 2007
- [j8]Tsung-I Lin, Jack C. Lee, Wan J. Hsieh:
Robust mixture modeling using the skew t distribution. Stat. Comput. 17(2): 81-92 (2007) - 2006
- [b1]Young-Hee Kim, Jack C. Lee:
Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability. Synthesis Lectures on Solid State Materials and Devices, Morgan & Claypool Publishers 2006, ISBN 978-3-031-01424-6 - [j7]Tsung-I Lin, Jack C. Lee, Hsiu J. Ho:
On fast supervised learning for normal mixture models with missing information. Pattern Recognit. 39(6): 1177-1187 (2006) - 2005
- [j6]Se Jong Rhee, Jack C. Lee:
Threshold voltage instability characteristics of HfO2 dielectrics n-MOSFETs. Microelectron. Reliab. 45(7-8): 1051-1060 (2005) - 2004
- [j5]Young-Hee Kim, Jack C. Lee:
Reliability characteristics of high-k dielectrics. Microelectron. Reliab. 44(2): 183-193 (2004) - [j4]Tsung-I Lin, Jack C. Lee, Huey F. Ni:
Bayesian analysis of mixture modelling using the multivariate t distribution. Stat. Comput. 14(2): 119-130 (2004) - 2001
- [j3]Fred Mintzer, Gordon W. Braudaway, Francis P. Giordano, Jack C. Lee, Karen A. Magerlein, Silvana D'Auria, Amnon Ribak, Gil Shapir, Fabio Schiattarella, John Tolva, Andrey Zelenkov:
Populating the Hermitage Museum's new web site. Commun. ACM 44(8): 52-60 (2001)
1990 – 1999
- 1996
- [j2]Frederick C. Mintzer, Leonard E. Boyle, Albert N. Cazes, Brian S. Christian, Steven C. Cox, Francis P. Giordano, Henry M. Gladney, Jack C. Lee, Milton L. Kelmanson, Antonio C. Lirani, Karen A. Magerlein, Ana M. B. Pavani
, Fabio Schiattarella:
Toward on-line, worldwide access to Vatican Library materials. IBM J. Res. Dev. 40(2): 139-162 (1996)
1980 – 1989
- 1982
- [j1]Arnold S. Tran, Richard A. Forsberg, Jack C. Lee:
A VLSI Design Verification Strategy. IBM J. Res. Dev. 26(4): 475-484 (1982) - [p1]Jack C. Lee:
5 Classification of growth curves. Classification, Pattern Recognition and Reduction of Dimensionality 1982: 121-137
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