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"18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI ..."
- 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 3-5 November 2003, Boston, MA, USA, Proceedings. IEEE Computer Society 2003, ISBN 0-7695-2042-1 [contents]
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