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"AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis."
M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre (2008)
- M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre:
AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis. DELTA 2008: 314-321
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