"Logic testing with test-per-clock pattern loading and improved diagnostic ..."

Ondrej Novák, Zdenek Plíva (2017)

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DOI: 10.1109/DDECS.2017.7934586

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-02

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Ondrej Novák, Zdenek Plíva:
Logic testing with test-per-clock pattern loading and improved diagnostic abilities. DDECS 2017: 54-59

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