"Retention time measurements and modelling of bit error rates of WIDE I/O ..."

Christian Weis et al. (2015)

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type: Conference or Workshop Paper

metadata version: 2021-08-09

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Christian Weis, Matthias Jung, Peter Ehses, Cristiano Santos, Pascal Vivet, Sven Goossens, Martijn Koedam, Norbert Wehn:
Retention time measurements and modelling of bit error rates of WIDE I/O DRAM in MPSoCs. DATE 2015: 495-500

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