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"An Efficient Test and Diagnosis Scheme for the Feedback Type of Analog ..."

Jun-Weir Lin, Chung-Len Lee, Jwu E. Chen (2002)

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DOI: 10.1109/DATE.2002.998475

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/date/LinLC02
Jun-Weir Lin, Chung-Len Lee, Jwu E. Chen:
An Efficient Test and Diagnosis Scheme for the Feedback Type of Analog Circuits with Minimal Added Circuits. DATE 2002: 1119

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