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"Defect-oriented test methodology for complex mixed-signal circuits."

F. C. M. Kuijstermans, Manoj Sachdev, A. P. Thijssen (1995)

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DOI: 10.1109/EDTC.1995.470425

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-20

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  dblp key:
  - conf/date/KuijstermansST95
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  persistent URL:
  - https://dblp.org/rec/conf/date/KuijstermansST95
F. C. M. Kuijstermans, Manoj Sachdev, A. P. Thijssen:
Defect-oriented test methodology for complex mixed-signal circuits. ED&TC 1995: 18-23

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