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"Defect aware X-filling for low-power scan testing."

S. Balatsouka et al. (2010)

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DOI: 10.1109/DATE.2010.5456928

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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  dblp key:
  - conf/date/BalatsoukaTKC10
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  persistent URL:
  - https://dblp.org/rec/conf/date/BalatsoukaTKC10
S. Balatsouka, Vasileios Tenentes, Xrysovalantis Kavousianos, Krishnendu Chakrabarty:
Defect aware X-filling for low-power scan testing. DATE 2010: 873-878

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