"Analysis of DC current crowding in through-silicon-vias and its impact on ..."

Xin Zhao, Michael Scheuermann, Sung Kyu Lim (2012)

> Home

Details and statistics

DOI: 10.1145/2228360.2228391

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/dac/ZhaoSL12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dac/ZhaoSL12
Xin Zhao, Michael Scheuermann, Sung Kyu Lim:
Analysis of DC current crowding in through-silicon-vias and its impact on power integrity in 3D ICs. DAC 2012: 157-162

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.