"Sequential Circuit Test Generation in a Genetic Algorithm Framework."

Elizabeth M. Rudnick et al. (1994)

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DOI: 10.1145/196244.196619

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/dac/RudnickPGN94
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Elizabeth M. Rudnick, Janak H. Patel, Gary S. Greenstein, Thomas M. Niermann:
Sequential Circuit Test Generation in a Genetic Algorithm Framework. DAC 1994: 698-704

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