"Optimal Ordering of Analog Integrated Circuit Tests to Minimize Test Time."

Scott D. Huss, Ronald S. Gyurcsik (1991)

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DOI: 10.1145/127601.127718

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Scott D. Huss, Ronald S. Gyurcsik:
Optimal Ordering of Analog Integrated Circuit Tests to Minimize Test Time. DAC 1991: 494-499

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