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"Novel sizing algorithm for yield improvement under process variation in ..."

Seung Hoon Choi, Bipul Chandra Paul, Kaushik Roy (2004)

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DOI: 10.1145/996566.996695

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/dac/ChoiPR04
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Seung Hoon Choi, Bipul Chandra Paul, Kaushik Roy:
Novel sizing algorithm for yield improvement under process variation in nanometer technology. DAC 2004: 454-459

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