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"A heuristic chip-level test generation algorithm."

Daniel S. Barclay, James R. Armstrong (1986)

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DOI: 10.1145/318013.318054

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/dac/BarclayA86
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  - https://dblp.org/rec/conf/dac/BarclayA86
Daniel S. Barclay, James R. Armstrong:
A heuristic chip-level test generation algorithm. DAC 1986: 257-262

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