default search action
"Real World Built-in Test for VLSI."
David R. Resnick (1986)
- David R. Resnick:
Real World Built-in Test for VLSI. COMPCON 1986: 436-440
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.