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"Characterization of radiation-induced SRAM and logic soft errors from ..."

Robert Pawlowski et al. (2014)

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DOI: 10.1109/CICC.2014.6946138

access: closed

type: Conference or Workshop Paper

metadata version: 2022-02-25

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  - conf/cicc/PawlowskiCCTDFQBC14
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Robert Pawlowski, Joseph Crop, Minki Cho, James W. Tschanz, Vivek De, Thomas Fairbanks, Heather Quinn, Shekhar Borkar, Patrick Yin Chiang:
Characterization of radiation-induced SRAM and logic soft errors from 0.33V to 1.0V in 65nm CMOS. CICC 2014: 1-4

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