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"Testability improvement for 12.8 GB/s Wide IO DRAM controller by small ..."

Takao Nomura et al. (2013)

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DOI: 10.1109/CICC.2013.6658415

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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  - conf/cicc/NomuraMITOFONMHKYT13
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  - https://dblp.org/rec/conf/cicc/NomuraMITOFONMHKYT13
Takao Nomura, Ryo Mori, Munehiro Ito, Koji Takayanagi, Toshihiko Ochiai, Kazuki Fukuoka, Kazuo Otsuga, Koji Nii, Sadayuki Morita, Tomoaki Hashimoto, Tsuyoshi Kida, Junichi Yamada, Hideki Tanaka:
Testability improvement for 12.8 GB/s Wide IO DRAM controller by small area pre-bonding TSV tests and a 1 GHz sampled fully digital noise monitor. CICC 2013: 1-4

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