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Junichi Yamada
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2010 – 2019
- 2013
- [c4]Takao Nomura, Ryo Mori, Munehiro Ito, Koji Takayanagi, Toshihiko Ochiai, Kazuki Fukuoka, Kazuo Otsuga, Koji Nii, Sadayuki Morita, Tomoaki Hashimoto, Tsuyoshi Kida, Junichi Yamada, Hideki Tanaka:
Testability improvement for 12.8 GB/s Wide IO DRAM controller by small area pre-bonding TSV tests and a 1 GHz sampled fully digital noise monitor. CICC 2013: 1-4
2000 – 2009
- 2002
- [j2]Junichi Yamada, Tohru Miwa, Hiroki Koike, Hideo Toyoshima, Kazushi Amanuma, Sota Kobayashi, Toru Tatsumi, Yukihiko Maejima, Hiromitsu Hada, Hidemitsu Mori, Seiichi Takahashi, Hidenori Takeuchi, Takemitsu Kunio:
A 128-kb FeRAM macro for contact/contactless smart-card microcontrollers. IEEE J. Solid State Circuits 37(8): 1073-1079 (2002) - 2001
- [j1]Tohru Miwa, Junichi Yamada, Hiroki Koike, Hideo Toyoshima, Kazushi Amanuma, Sota Kobayashi, Toru Tatsumi, Yukihiko Maejima, Hiromitsu Hada, Takemitsu Kunio:
NV-SRAM: a nonvolatile SRAM with backup ferroelectric capacitors. IEEE J. Solid State Circuits 36(3): 522-527 (2001) - [c3]Hideo Toyoshima, Sota Kobayashi, Junichi Yamada, Tohru Miwa, Hiroki Koike, Hidenori Takeuchi, Hidemitsu Mori, Naoki Kasai, Yukihiko Maejima, Nobuhira Tanabe, Toru Tatsumi, Hiromitsu Hada:
FeRAM device and circuit technologies fully compatible with advanced CMOS. CICC 2001: 171-178 - 2000
- [c2]Tohm Miwa, Junichi Yamada, Hiroki Koike, Hideo Toyoshima, Kazushi Amanuma, Sota Kobayashi, Tom Tatsumi, Yukihiro Maejima, Hiromitsu Hada, Takemitsu Kunio:
NV-SRAM: a nonvolatile SRAM with back-up ferroelectric capacitors. CICC 2000: 65-68
1990 – 1999
- 1998
- [c1]Tohru Miwa, Junichi Yamada, Yuji Okamoto, Hiroki Koike, Hideo Toyoshiina, Hiromitsu Hada, Yoshihiro Hayashi
, Hiroaki Oliizaki, Yoichi Miyasalca, Takemitsu Kunio, Hidenobu Miyamoto, Hideki Gomi, Hiroshi Kitajima:
An embedded FeRAM macro cell for a smart card microcontroller. CICC 1998: 439-442
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