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"A soft-error-immune maintenance-free TCAM architecture with associated ..."

Hideyuki Noda et al. (2005)

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DOI: 10.1109/CICC.2005.1568703

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Hideyuki Noda, Katsumi Dosaka, Fukashi Morishita, Kazutami Arimoto:
A soft-error-immune maintenance-free TCAM architecture with associated embedded DRAM. CICC 2005: 451-454

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