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"TOF: a tool for test pattern generation optimization of an FPGA ..."
Michel Renovell et al. (2000)
- Michel Renovell, Jean-Michel Portal, Penelope Faure, Joan Figueras, Yervant Zorian:

TOF: a tool for test pattern generation optimization of an FPGA application oriented test. Asian Test Symposium 2000: 323-328

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