"On Improving Defect Coverage of Stuck-at Fault Tests."

Kohei Miyase et al. (2005)

> Home

Details and statistics

DOI: 10.1109/ATS.2005.84

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ats/MiyaseTKWR05
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/MiyaseTKWR05
Kohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen, Sudhakar M. Reddy:
On Improving Defect Coverage of Stuck-at Fault Tests. Asian Test Symposium 2005: 216-223

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.