"An Automatic Test Pattern Generator for At-Speed Robust Path Delay Testing."

Yuan-Chieh Hsu, Sandeep K. Gupta (1998)

> Home

Details and statistics

DOI: 10.1109/ATS.1998.741595

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-22

- view
  authority control:
- export record
  dblp key:
  - conf/ats/HsuG98
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ats/HsuG98
Yuan-Chieh Hsu, Sandeep K. Gupta:
An Automatic Test Pattern Generator for At-Speed Robust Path Delay Testing. Asian Test Symposium 1998: 88-95

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.